Select Page

Electron Microbeam Analysis Lab (EMAL)

by | Dec 1, 2018

WordPress database error: [You have an error in your SQL syntax; check the manual that corresponds to your MariaDB server version for the right syntax to use near ') AND post_type IN ('building-cpt', 'core') AND post_status = 'publish'' at line 1]
SELECT object_id, term_taxonomy_id FROM wp0h_term_relationships INNER JOIN wp0h_posts ON object_id = ID WHERE term_taxonomy_id IN () AND post_type IN ('building-cpt', 'core') AND post_status = 'publish'

Electron Microbeam Analysis Lab (EMAL)

provides instrumentation for the chemical and structural characterization of solid materials.

Home » Cores » Electron Microbeam Analysis Lab (EMAL)

Contacts

Owen Neill, PhD
734-615-6657
[email protected]

Zhongrui (Jerry) Li, PhD
734-615-6657
[email protected]

Location

North University Building (Rm 2005)
1100 N. University Ave, Ann Arbor, MI

Affiliations
Literature, Science and the Arts

Who We Serve

University of Michigan Researchers and External Researchers

Visit Core Website

Core Summary

The Robert B. Mitchell Electron Microbeam Analysis Lab (EMAL) provides instrumentation for researchers from a variety of disciplines for the chemical and structural characterization of solid materials. The lab houses a variety of electron microbeam and X-ray analysis instruments for materials characterization, focused mainly on imaging, quantitative and qualitative compositional analysis, and micro- and nano-structural analysis. EMAL facilities are used by researchers in a broad range of disciplines, including geology, chemistry, physics, biology, materials science, archaeology, engineering, medicine, archaeology, and even art.

 

Service Categories: Chemical, Material and Protein Characterization; Data Tools and Analysis ; Education and Training ; Engineering ; Imaging

Services

  • Backscattered electron imaging

  • Chemical analysis

  • Compositional mapping

  • Electron backscatter diffraction

  • Electron microscopy

  • Energy-dispersive X-ray spectroscopy

  • Materials characterization

  • Microanalysis

  • Microscopy

  • Secondary electron imaging

  • Wavelength-dispersive X-ray spectroscopy

  • X-ray diffraction

  • X-ray mapping


Equipment

  • Carbon coater Carbon Coater
    Denton, Equipment Available For Use
  • Electron microprobe SX100
    Cameca, Equipment Available For Use
  • Gold coater Desk II
    Denton, Equipment Available For Use
  • Scanning electron microscope JSM-7800F
    JEOL, Equipment Available For Use
  • X-ray diffractometer UltimaIV
    Rigaku, Equipment Available For Use