Michigan Center for Materials Characterization (MC)2

is dedicated to the micron and nanoscale imaging and analysis of materials.

Contacts

Bobby Kerns
734-647-6845
kernsr@umich.edu

Deana Wendel
734-763-1041
dlwendel@umich.edu

Location

NCRC Building 22 (Rm G010)
2800 Plymouth Road, Ann Arbor, MI

Affiliations
Engineering

Who We Serve

University of Michigan Researchers and External Researchers

Core Summary

The Michigan Center for Materials Characterization, also known as (MC)2, is the University of Michigan’s facility dedicated to the micron and nanoscale imaging and analysis of materials.  (MC)2 provides state-of-the-art instruments, professional training, and in-depth education for students and researchers from all across campus, local industry, and fellow academic institutions.

Service Categories: Chemical, Material and Protein Characterization Service Categories: Data Tools and Analysis Service Categories: Education and Training Service Categories: Imaging

Services

Chemical analysis

CT
MicroCT scanning and analysis, NanoCT scanning and analysis,

Imaging
Micron and nanoscale imaging,

Material characterization

Microscopy
Scanning electron microscopy, Transmission electron microscopy,

Service Work

Specimen preparation

Spectroscopy

Training


Equipment

3D X-ray Microscopy
Zeiss Xradia Versa 520 3D X-ray Microscope with DCT module,

Atom Probe Tomography
Cameca LEAP 5000HR,

Atomic Force Microscopy
Veeco Dimension Icon AFM,

Electron Microscopy Accessories
Gatan Model 626 Cryo TEM holder, Hummingbird Scientific Liquid Flow TEM holder, Hysitron PicoIndenter, Leica cryo stage for SEM,

Mechanical Properties
Hysitron TriboIndenter,

Raman spectroscopy instruments
TESCAN RISE,

Scanning Electron and Focused Ion Beam Instruments (SEM/FIB)
FEI Helios 650 Nanolab SEM/FIB, FEI Nova 200 Nanolab SEM/FIB, FEI Quanta 3D SEM/FIB,

Scanning Electron Microscopy (SEM)
TESCAN MIRA3 FEG SEM, TESCAN RISE,

Specimen preparation
Benchmark Hotplate Stirrer, Buehler Ecomet 3 Variable Speed Grinder-Polisher, Fischione Model 1020 Plasma Cleaner, Fisher Scientific FS20D Ultrasonic Cleaner, Gatan Model 601 Ultrasonic Disk Cutter, Gatan Model 656 Dimple Grinder, Gatan Model 691 PIPS, Nikon Microscope with Scion CCD Camera, Nikon SMZ 745 Microscope, Nikon SMZ 745T Microscope with Panasonic TV Camera, Reichert-Jung Ultracut E, SBT Model 360 Disc Dril, SBT Model 650 Low Speed Diamond Wheel Saw, SBT Wire Saw, SPI-Module Carbon/Sputter Coater, SYBRON-Thermolyne Hot Plate Oven OV 10600, Ted Pella LKB 7800 Knifemaker, Thermolyne Type 1000 Stir Plate,

Transmission Electron Microscopy
JEOL 2010F Analytical Electron Microscope, JEOL 2100F Probe-Corrected Electron Microscope, JEOL 3011 High Resolution Electron Microscope, JEOL 3100R05 Double Cs Corrected TEM/STEM,

X-ray PhotoElectron Spectroscopy
Kratos Axis Ultra XPS,